• Lab Use Atomic Force Microscope Afm
  • Lab Use Atomic Force Microscope Afm
  • Lab Use Atomic Force Microscope Afm
  • Lab Use Atomic Force Microscope Afm
  • Lab Use Atomic Force Microscope Afm
  • Lab Use Atomic Force Microscope Afm

Lab Use Atomic Force Microscope Afm

After-sales Service: Long Time Online Guidance
Warranty: 1 Year
Magnification: Atomic Force Microscope
Mobility: Desktop
Stereoscopic Effect: Stereoscopic Effect
Usage: Research
Customization:
Gold Member Since 2015

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  • Overview
  • Product Description
  • Detailed Photos
  • Product Parameters
  • <span style="font-size:16px;"><span style="font-size:16px;">Related products</span></span>
  • <span style="font-size:16px;"><span style="font-size:16px;">Packaging & Shipping</span></span>
  • <span style="font-size:16px;"><span style="font-size:16px;">Company Profile</span></span>
  • <span style="font-size:16px;"><span style="font-size:16px;">Certifications</span></span>
  • <span style="font-size:16px;"><span style="font-size:16px;">FAQ</span></span>
Overview

Basic Info.

Principle
Optics
Basic Working Mode
Contact,Tapping,F-Z Force Curve,RMS-Z Curve
Sample Size
Diameter <90mm H<20mm
Scanning Range
Xy to 20um, Z to 2um
Scanning Resolution
Xy to 0.2nm,Z to 0.05nm
Sample Moving Range
0-13mm
Scanning Angle
0-360
Trademark
NANBEI
Origin
Zhengzhou
Production Capacity
100pieces/Month

Product Description

Product Description

Lab Use Atomic Force Microscope AFM

Application and Usage
 Atomic Force Microscopy (AFM), an analytical instrument that can be used to study the surface texture of solid materials, including insulators.It examines the surface structure and properties of a substance by detecting a very weak interatomic force between the surface of the sample to be measured and a micro-force-sensitive element.When the sample is scanned, these changes can be detected by the sensor to obtain the force distribution information, so as to obtain the surface topography structure information and the surface roughness information at the nanoscale resolution.

Lab Use Atomic Force Microscope Afm
Features

1. Integrated scanning probe and sample stagenhanced the anti-interference ability.

2.  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.

3. By using thesample probe approaching manner,the needle could perpendicular to thesample scanning.       

4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.

5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.

6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.

7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.

8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.

    9.    Spring suspension which simple and practicalenhanced anti-interference ability.

 

Detailed Photos

Lab Use Atomic Force Microscope Afm
Lab Use Atomic Force Microscope Afm

 

Product Parameters

Work mode: FM-Tapping, optional contact, friction, phase,magnetic or electrostatic

2,Size:Φ≤90mm,H≤20mm

3,Scanningrange:20 mmin XYdirection,2 mm in Z direction.

4,Scanningresolution:0.2nm in XY direction,0.05nm in Z direction.

5,Movementrange of sample:±6.5mm.

6,Pulse width ofthe motor approaches:10±2ms.

7,Image sampling point:256×256,512×512.

8,  optical magnification 4X,opticalresolution 2.5 mm.

9,Scanrate 0.6Hz~4.34Hz,scanangle 0°~360°.

10,Scanningcontrol : 18-bit D/A in XY direction,16-bit D/A in Z direction.

11,Datasampling:14-bitA/D,double16-bit A/D multi-channel synchronous sampling.

12,Feedback:DSP digital feedback.

13,Feedbacksampling rate:64.0KHz.

14,Computerinterface:USB2.0.

15,Operatingenvironment:Windows98/2000/XP/7/8.

Related products

Lab Use Atomic Force Microscope Afm
Lab Use Atomic Force Microscope Afm

 

Packaging & Shipping

Lab Use Atomic Force Microscope Afm

Company Profile

 

Lab Use Atomic Force Microscope Afm

Certifications

Lab Use Atomic Force Microscope Afm

FAQ

Q1: Why Choose NANBEI ?
(1).Professional manufacturer with more than 13 years experience
(2).Exported to more than 97% Countries
(3).Turnkey Solution is no problem

Q2:OEM,ODM acceptable or not?
Absolutely Yes

Q3:What's kind of Payment terms for customer choosing?
T/T ,Western Union, Money Gram , Credit Card, Paypal , L/C ...

Q4:Can you visit your factory online?
Absolutely no problem

Q5:Can online video inspection before shipment?
Absolutely no problem

Q6: what's the MOQ ? Sample order is OK?
MOQ:1 set, sample order is no problem

Q7:What's kind of shipment for customer choosing?
Usually ship by sea, by air, by international express .
We can also provide reasonable solutions according to your transportation requirements

Q8:How to ensure product quality and after-sales service?
We have CE, ISO quality certificate, and SGS authentication.

After-sale service:

  1. Warranty : 1 year
  2. We supply free part for quality problem in warranty
  3. Long life technical support and service


 

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